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BIOGRAPHICAL SKETCH FOR RICK HAUENSTEIN

Over 35 years in manufacturing and test. Industries include semiconductors (both fabless and fab), "light electronics," aerospace, consumer electronics, publishing Clients include IBM, Texas Instruments, Motorola, Advanced Micro Devices, KLA Instruments, Applied Materials, Tracor Aerospace, Lockheed Missiles and Space Company/Lockheed-Martin, National Semiconductor, Samsung, Hyundai, Dell Computers, Hewett Associates, SC Johnson, and others. Developed and conducted training classes in basic electronics, dc parametric testing and test methodology, and computer applications Wrote, edited, and published technical documentation (such as users' manuals, installation manuals, and applications notes/white papers), public relations material, and newsletters Created guides for program management procedures, capital appropriations, and company specific software procedures Developed Design-to-Cost, Design-to-Quality, and Value Engineering procedures Created computerized on-line troubleshooting guides for wafer fab processes Managed failure analysis lab for consumer products and semiconductor industry Created math models for manufacturing and test simulations Developed return-rate failure models used for customer repair forecasting Established calibration procedures and metrology guidelines for general electronics test equipment and semiconductor monitoring equipment

SELECTED PUBLICATIONS

• Contributing author, edited by Publishers' Resource Group, Chemistry: Connections To Our Changing world, Prentice Hall
• Hauenstein, L. R., edited by Dr. Kash Mittal, Cosmetics as a Possible Source of Particulate Contamination, PARTICLES IN GASES AND LIQUIDS: DETECTION AND CONTROL, Plenum Press, New York, NY
• Hauenstein, L. R., Cosmetics in the Clean Room: Is it a Problem?, Cleanrooms
• Hauenstein, L. R., Theory of Optical Cross Sections of Deep Level Impurities in Covalently Bonded Semiconductors, Texas Tech University Press, Lubbock, TX
• Hauenstein, L. R., Isolating and Controlling ESD Contamination in Wafer Fabs, paper/presentation at the quarterly worldwide contamination seminar held at Motorola, Austin, TX
• Hauenstein, L. R., Contamination Control Procedures, paper/presentation at the quarterly worldwide contamination control seminar held at Motorola, Phoenix, AZ
• Hauenstein, L. R., Cash Flow Analysis, self published
• Hauenstein, L. R., Developing Standard Times, self published
• Hauenstein, L. R., Reliability Models, paper and presentation sponsored by the ACCA (Association of Colleges in the Chicago Area) held at Elmhurst College, Elmhurst, IL

PROFESSIONAL AFFILIATIONS

• Senior member of the Austin (TX) Chapter of the Institute of Industrial Engineers (past president)
• Member of the Austin Writers' League and San Gabriel Writers' League
• Lake County Chamber of Commerce
• Society for Technical Communications
• Registered Professional Engineer (Texas), #60012

• MS in Applied Physics, Texas Tech University, Lubbock, TX
  • Thesis: Theory of Optical Cross Sections of Deep Level Impurities in Covalently Bonded Semiconductors
• BS in Industrial Engineering, Texas Tech University, Lubbock, TX
• Web Master Certificate (Programming/Design Graphics/Data Base), Austin Community College, Austin, TX
• Localization/Globalization Certificate, Austin Community College, Austin, TX
• AA in Technical Communications, DeAnza College, Cupertino, CA
• Associate of Applied Science in Electronics Engineering Technology, DeVry University, Chicago, IL